DUV and EUV Photo-Lithography Solutions For The 7nm Technology/ Ahmed Wasim Ibrahim Elsaid

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TextLanguage: English Summary language: English Publication details: 2015Description: p. ill. 21 cmSubject(s):

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Dissertation note: Thesis (M.A.)—Nile University, Egypt, 2015 . Abstract: Abstract:

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Item type	Current library	Call number	Status	Date due	Barcode
Thesis	Main library	621/A.W.D 2015 (Browse shelf(Opens below))	Not for loan

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Supervisor: Rafik Guindi

Thesis (M.A.)—Nile University, Egypt, 2015 .

"Includes bibliographical references"

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Abstract:

Text in English, abstracts in English.

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