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DUV and EUV Photo-Lithography Solutions For The 7nm Technology/

Ahmed Wasim Ibrahim Elsaid

DUV and EUV Photo-Lithography Solutions For The 7nm Technology/ Ahmed Wasim Ibrahim Elsaid - 2015 - p. ill. 21 cm.

Supervisor: Rafik Guindi

Thesis (M.A.)—Nile University, Egypt, 2015 .

"Includes bibliographical references"

Contents:

Abstract:

Text in English, abstracts in English.

Subjects--Topical Terms:
MSD

Index Terms--Genre/Form:
Dissertation, Academic

Dewey Class. No.: 621

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