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Nanoscale CMOS VLSI circuits : design for manufacturability / Sandip Kundu, Aswin Sreedhar.

By: Contributor(s): Material type: TextTextPublication details: New York : McGraw-Hill, c2010.Description: xv, 296 p. : ill. ; 24 cmISBN:
  • 9780071635196
  • 007163519X
Other title:
  • Nanoscale complementary metal oxide semiconductor very large-scale integration circuits [Cover title]
Subject(s): DDC classification:
  • 621.395   22
Contents:
Semiconductor manufacturing -- Process and device variability : analysis and modeling -- Manufacturing-aware physical design closure -- Metrology, manufacturing defects, and defect extraction -- Defect impact modeling and yield improvement techniques -- Physical design and reliability -- Design for manufacturability : tools and methodologies.
Summary: This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on delivering higher performance and lower power consumption. Costs, constraints, and computational efficiencies are also discussed in the practical resource.
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Holdings
Item type Current library Call number Copy number Status Date due Barcode
Books Books Main library General Stacks 621.395 / KU.N 2010 (Browse shelf(Opens below)) 1 Available 011874
Books Books Main library General Stacks 621.395 / KU.N 2010 (Browse shelf(Opens below)) 2 Available 011883
Browsing Main library shelves, Shelving location: General Stacks Close shelf browser (Hides shelf browser)
621.395 / KA.S 2005 Contemporary logic design / 621.395 / KA.V 2011 VHDL 101 : 621.395 / KU.N 2010 Nanoscale CMOS VLSI circuits : 621.395 / KU.N 2010 Nanoscale CMOS VLSI circuits : 621.395 / KU.S 2009 Switching Theory and Logic Design. 621.395 / LE.V 2011 VLSI for wireless communication / 621.395 / MA.A 2003 Analog design for CMOS VLSI systems /

Includes bibliographical references and index.

Semiconductor manufacturing -- Process and device variability : analysis and modeling -- Manufacturing-aware physical design closure -- Metrology, manufacturing defects, and defect extraction -- Defect impact modeling and yield improvement techniques -- Physical design and reliability -- Design for manufacturability : tools and methodologies.

This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on delivering higher performance and lower power consumption. Costs, constraints, and computational efficiencies are also discussed in the practical resource.

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