000			02480cam a22003254a 4500
008			101202s2008 ne a b 001 0 eng
010			_a2007023373
020			_a9780123739735
020			_a012373973X
035			_a(Sirsi) u7757
040			_aEG-CaNU _c EG-CaNU _d EG-CaNU
042			_ancode
082	0	0	_a621.395 _2 22
245	0	0	_aSystem-on-chip test architectures : _b nanometer design for testability / _c edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
260			_aAmsterdam ; _a Boston : _b Morgan Kaufmann Publishers, _c c2008.
300			_axxxvi, 856 p. : _b ill. ; _c 25 cm.
504			_aIncludes bibliographical references and index.
505	0		_aIntroduction; Digital Test Architectures; Fault-Tolerant Design; SOC/NOC Test Architectures; SIP Test Architectures; Delay Testing; Low-Power Testing; Coping with Physical Failures, Soft Errors, and Reliability Issues; Design for Manufacturability and Yield; Design for Debug and Diagnosis; Software-Based Self-Testing; FPGA Testing; MEMS Testing; High-Speed I/O Interface; Analog and Mixed-Signal Test Architectures; RF Testing; Testing Aspects of Nanotechnology Trends.
520			_aModern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs.
650		0	_aSystems on a chip _x Testing. _913931
650		0	_aIntegrated circuits _x Very large scale integration _x Testing. _913932
650		0	_aIntegrated circuits _x Very large scale integration _x Design. _913933
700	1		_aWang, Laung-Terng. _9240
700	1		_aStroud, Charles E. _913934
700	1		_aTouba, Nur A. _913935
598			_a APPSCIE, NBK
596			_a1
999			_c6713 _d6713