| 000 | 02562cam a22002891a 4500 | ||
|---|---|---|---|
| 008 | 100805s2010 nyua b 001 0 eng | ||
| 010 | _a2010923482 | ||
| 020 | _a9781441959744 | ||
| 035 | _a(Sirsi) u7691 | ||
| 040 |
_aEG-CaNU _c EG-CaNU _d EG-CaNU |
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| 042 | _ancode | ||
| 082 | 0 | 0 |
_a 570.28/25 _2 23 |
| 700 | 1 |
_aAyache, Jeanne. _913785 |
|
| 245 | 1 | 0 |
_aSample preparation handbook for tranmission electron microscopy. _v Volume 2. _p techniques / _c Jeanne Ayache, Luc Beaunier. |
| 250 | _a1st ed. | ||
| 260 |
_aNew York : _b Springer, _c 2010. |
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| 300 |
_axxv, 338 p. : _b ill ; _c 24 cm. |
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| 504 | _aIncludes bibliographical references and index. | ||
| 505 | 0 | _aIntroduction.- Preliminary preparation techniques.- Thinning preparation techniques.- Mechanical preparation techniques.- Replica techniques.- Techniques specific to fine particles.- Contrast-enhancement and labeling techniques.- | |
| 520 | _aThis two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. Sample Preparation Handbook for Transmission Electron Microscopy: Volume 2: Techniques describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab. Key Features of the Handbook:Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level)Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide*Written by authors with 100 years of combined experience in electron | ||
| 650 | 0 |
_aElectron microscopy _91604 |
|
| 650 | 0 |
_aMaterial Science _96640 |
|
| 650 | 0 |
_aNanotechnology _9887 |
|
| 700 | 1 |
_a Ayache, Jeanne, _d 1951- _913786 |
|
| 596 | _a1 | ||
| 920 | _a 1441959742 (hdbk. : acid-free paper) | ||
| 999 |
_c6655 _d6655 |
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