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	1.	Statistical quality design and control : contemporary concepts and methods / Richard E. DeVor, Tsong-how Chang, John W. Sutherland. by DeVor, Richard E Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : Toronto : New York : Macmillan ; Maxwell Macmillan Canada ; Maxwell Macmillan International, c1992 Availability: Items available for loan: Main library (1)Call number: 658.562015195 / DE. S 1992. Place hold Log in to add tags Add to cart (remove)
	2.	Process control instrumentation technology / Curtis D. Johnson. by Johnson, Curtis D, 1939- Edition: 5th ed. Material type: Text; Format: print ; Literary form: Not fiction Publication details: Upper Saddle River, N.J. ; London : Prentice-Hall International, c1997 Availability: Items available for loan: Main library (1)Call number: 670.427 JO. P 1997. Place hold Log in to add tags Add to cart (remove)
	3.	Fundamentals of semiconductor manufacturing and process control / Gary S. May, Costas J. Spanos. by May, Gary S Spanos, Costas J Material type: Text; Format: print ; Literary form: Not fiction Publication details: [Piscataway] : Hoboken, N.J. : IEEE ; Wiley-Interscience, c2006 Availability: Items available for loan: Main library (1)Call number: 621.38152 / MA.F 2006. Place hold Log in to add tags Add to cart (remove)
	4.	Product management in practice : a real-world guide to the key connective role of the 21st century / Matt LeMay. by LeMay, Matthew [author.] Edition: [Revised edition] Material type: Text; Format: print ; Literary form: Not fiction Publisher: Beijing : O'Reilly, [2018]Copyright date: ©2018 Availability: Items available for loan: Main library (1)Call number: 658.5/LM.P. Place hold Log in to add tags Add to cart (remove)