Ahmed Wasim Ibrahim Elsaid
DUV and EUV Photo-Lithography Solutions For The 7nm Technology/
Ahmed Wasim Ibrahim Elsaid
- 2015
- p. ill. 21 cm.
Supervisor: Rafik Guindi
Thesis (M.A.)—Nile University, Egypt, 2015 .
"Includes bibliographical references"
Contents:
Abstract:
Text in English, abstracts in English.
MSD
Dissertation, Academic
621