DeVor, Richard E. <br/><br/>
Statistical quality design and control :    contemporary concepts and methods /  
Richard E. DeVor, Tsong-how Chang, John W. Sutherland. 
 - New York :    Toronto :    New York :    Macmillan ;    Maxwell Macmillan Canada ;    Maxwell Macmillan International,    c1992. 
 - xvi, 809 p. :    ill. (some col.) ;    25 cm. 
<br/><br/> includes bibliographical references (p. 780-786) and index. 
<br/><br/><label>ISBN: </label>002329180X 9780023291807 
<br/><br/><label>LCCN: </label>91003045 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Quality control -- Statistical methods.<br/>Process control -- Statistical methods.
<br/><br/><label>Dewey Class. No.: </label>658.562015195