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Pattern recognition / Sergios Theodoridis, Konstantinos Koutroumbas.

By: Contributor(s): Material type: TextTextPublication details: Amsterdam ; London : Elsevier/Academic Press, c2009.Edition: 4th edDescription: a xvii, 961 p. : ill. ; 25 cmISBN:
  • 1597492728 (hbk.)
  • 9781597492720
Subject(s): DDC classification:
  • 006.4   22
Contents:
1. Introduction -- 2. Classifiers based on Bayes Decision -- 3. Linear Classifiers -- 4. Nonlinear Classifiers -- 5. Feature Selection -- 6. Feature Generation I: Data Transformation and Dimensionality Reduction -- 7. Feature Generation II -- 8. Template Matching -- 9. Context Depedant Clarification -- 10. System Evaultion -- 11. Clustering: Basic Concepts -- 12. Clustering Algorithms: Algorithms L Sequential -- 13. Clustering Algorithms II: Hierarchical -- 14. Clustering Algorithms III: Based on Function Optimization -- 15. Clustering Algorithms IV: Clustering -- 16. Cluster Validity.
Summary: This book considers classical and current theory and practice, of supervised, unsupervised and semi-supervised pattern recognition, to build a complete background for professionals and students of engineering. The authors, leading experts in the field of pattern recognition, have provided an up-to-date, self-contained volume encapsulating this wide spectrum of information. The very latest methods are incorporated in this edition: semi-supervised learning, combining clustering algorithms, and relevance feedback.
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Holdings
Item type Current library Call number Copy number Status Date due Barcode
Books Books Main library General Stacks 006.4 / TH.P 2009 (Browse shelf(Opens below)) 1 Available 004244

Previous ed.: Amsterdam: Academic, 2003.

Includes bibliographical references and index.

1. Introduction -- 2. Classifiers based on Bayes Decision -- 3. Linear Classifiers -- 4. Nonlinear Classifiers -- 5. Feature Selection -- 6. Feature Generation I: Data Transformation and Dimensionality Reduction -- 7. Feature Generation II -- 8. Template Matching -- 9. Context Depedant Clarification -- 10. System Evaultion -- 11. Clustering: Basic Concepts -- 12. Clustering Algorithms: Algorithms L Sequential -- 13. Clustering Algorithms II: Hierarchical -- 14. Clustering Algorithms III: Based on Function Optimization -- 15. Clustering Algorithms IV: Clustering -- 16. Cluster Validity.

This book considers classical and current theory and practice, of supervised, unsupervised and semi-supervised pattern recognition, to build a complete background for professionals and students of engineering. The authors, leading experts in the field of pattern recognition, have provided an up-to-date, self-contained volume encapsulating this wide spectrum of information. The very latest methods are incorporated in this edition: semi-supervised learning, combining clustering algorithms, and relevance feedback.

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