MARC details
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
| fixed length control field |
120530s2010 mauaf b 001 0 eng |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
| LC control number |
2010279220 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
| International Standard Book Number |
9781596932715 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
| International Standard Book Number |
1596932716 |
| 035 ## - SYSTEM CONTROL NUMBER |
| System control number |
(Sirsi) u8215 |
| 040 ## - CATALOGING SOURCE |
| Original cataloging agency |
EG-CaNU |
| Transcribing agency |
EG-CaNU |
| Modifying agency |
EG-CaNU |
| 042 ## - AUTHENTICATION CODE |
| Authentication code |
ncode |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
| Classification number |
621.3815 |
| Edition number |
22 |
| 245 00 - TITLE STATEMENT |
| Title |
Substrate noise coupling in analog/RF circuits / |
| Statement of responsibility, etc. |
Stephane Bronckers, Geert van der Plas, Gerd Vandersteen, Yves Rolain. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
| Place of publication, distribution, etc. |
Norwood, MA : |
| Name of publisher, distributor, etc. |
Artech House, |
| Date of publication, distribution, etc. |
c2010. |
| 300 ## - PHYSICAL DESCRIPTION |
| Extent |
xvii, 241 p., [8] p. of plates : |
| Other physical details |
ill. (some col.) ; |
| Dimensions |
24 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
| Bibliography, etc. note |
Includes bibliographical references and index. |
| 505 0# - FORMATTED CONTENTS NOTE |
| Formatted contents note |
Introduction. Substrate Noise Propagation. Isolation Structures. Impact of Substrate Noise on a 900MHz LC-VCO. Impact of Substrate Noise on Analog/RF/mm-wave circuits using a 3D-field solver. PA/VCO Coupling. Conclusions. |
| 520 ## - SUMMARY, ETC. |
| Summary, etc. |
This practical resource offers you detailed guidance on the impact of substrate noise on a wide range of circuits operating from baseband frequencies up to mm-wave frequencies. This unique book presents case studies to illustrate that careful modeling of the assembly characteristics and layout details is required to bring simulations and measurements into agreement. You learn how to use a proper combination of isolation structures and circuit techniques to make analog/RF circuits more immune to substrate noise. |
| 596 ## - |
| -- |
1 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name entry element |
Radio frequency integrated circuits |
| General subdivision |
Design and construction. |
| 9 (RLIN) |
15033 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name entry element |
Electronic circuits |
| General subdivision |
Noise. |
| 9 (RLIN) |
15034 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name entry element |
Substrate noise |
| General subdivision |
Prevention. |
| 9 (RLIN) |
15035 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name entry element |
Electronic noise. |
| 9 (RLIN) |
15036 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Bronckers, Stephane. |
| 9 (RLIN) |
15037 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Van der Plas, Geert. |
| 9 (RLIN) |
15038 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Vandersteen, Gerd. |
| 9 (RLIN) |
15039 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Rolain, Yves. |
| 9 (RLIN) |
15040 |