MARC details
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
110419s2009 flua b 001 0 eng |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
|---|
| LC control number |
2008030739 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9781420042948 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
1420042947 |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(Sirsi) u7867 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
EG-CaNU |
| Transcribing agency |
EG-CaNU |
| Modifying agency |
EG-CaNU |
| 042 ## - AUTHENTICATION CODE |
|---|
| Authentication code |
ncode |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
620.110287 |
| Edition number |
22 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Zhang, Sam |
| 9 (RLIN) |
5196 |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Materials characterization techniques / |
| Statement of responsibility, etc. |
Sam Zhang, Lin Li, Ashok Kumar. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Boca Raton : |
| Name of publisher, distributor, etc. |
CRC Press, |
| Date of publication, distribution, etc. |
c2009. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
328 p. : |
| Other physical details |
ill. ; |
| Dimensions |
25 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes bibliographical references and index. |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Introduction -- Contact Angle in Surface Analysis -- Measuring Contact Angle -- Determining Surface Energy of a Homogeneous Solid Surface -- Work Examples -- X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy -- Atomic Model and Electron Configuration -- Principles of XPS and AES -- Instrumentation -- Routine Limits of XPS -- XPS Applications and Case Studies -- AES Applications -- Scanning Tunneling Microscopy and Atomic Force Microscopy -- Working Principle -- Instrumentation -- Modes of Operation -- Differences between STM and AFM -- Applications -- X-ray Diffraction -- X-ray Characteristics and Generation -- Lattice Planes and Bragg’s Law -- Powder Diffraction -- Thin Film Diffraction -- Texture Measurement -- Grazing Angle -- X-ray Diffraction -- Transmission Electron Microscopy -- Basics of Transmission Electron Microscopes -- Reciprocal Lattice -- Specimen Preparation -- Bright-Field and Dark-Field Images -- Electron Energy Loss Spectroscopy -- Scanning Electron Microscopy -- Introduction to Scanning Electron Microscopes -- Electron Beam–Specimen Interaction -- SEM Operating Parameters -- Applications -- Chromatographic Methods -- General Principles of Chromatography -- Ion Exchange Chromatography -- Gel Permeation Chromatography -- Gel Electrophoresis Chromatography -- High-Performance Liquid Chromatography -- Gas Chromatography -- Quantitative Analysis Methods -- Infrared Spectroscopy and UV/Vis Spectroscopy -- Infrared Radiation Spectroscopy -- Ultraviolet/Visible Spectroscopy -- Macro and Micro Thermal Analyses -- Macro and Micro Differential Scanning Calorimetry -- Isothermal Titration Calorimetry -- Thermogravimetric Analysis -- Laser Confocal Fluorescence Microscopy -- Fluorescence and Fluorescent Dyes -- Fluorescence Microscopy -- Laser Confocal Fluorescence -- Microscopy -- Applications of LCFM -- Index. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today—whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material’s structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researchers apply basic principles of chemistry, physics, and biology to address its scientific fundamentals, as well as how it is processed and engineered for use. Emphasizing practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used, advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement. |
| 596 ## - |
|---|
| -- |
1 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Materials |
| General subdivision |
Testing. |
| 9 (RLIN) |
14183 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Li, L. |
| Fuller form of name |
(Lin), |
| Dates associated with a name |
1959- |
| 9 (RLIN) |
14184 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Kumar, Ashok, |
| Dates associated with a name |
1962- |
| 9 (RLIN) |
14185 |