MARC details
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
100805s2010 nyua b 001 0 eng |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
|---|
| LC control number |
2010923482 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9781441959744 |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(Sirsi) u7691 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
EG-CaNU |
| Transcribing agency |
EG-CaNU |
| Modifying agency |
EG-CaNU |
| 042 ## - AUTHENTICATION CODE |
|---|
| Authentication code |
ncode |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
570.28/25 |
| Edition number |
23 |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Sample preparation handbook for tranmission electron microscopy. |
| -- |
Volume 2. |
| Name of part/section of a work |
techniques / |
| Statement of responsibility, etc. |
Jeanne Ayache, Luc Beaunier. |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
1st ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
New York : |
| Name of publisher, distributor, etc. |
Springer, |
| Date of publication, distribution, etc. |
2010. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xxv, 338 p. : |
| Other physical details |
ill ; |
| Dimensions |
24 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes bibliographical references and index. |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Introduction.- Preliminary preparation techniques.- Thinning preparation techniques.- Mechanical preparation techniques.- Replica techniques.- Techniques specific to fine particles.- Contrast-enhancement and labeling techniques.- |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. Sample Preparation Handbook for Transmission Electron Microscopy: Volume 2: Techniques describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab. Key Features of the Handbook:Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level)Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide*Written by authors with 100 years of combined experience in electron |
| 596 ## - |
|---|
| -- |
1 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Electron microscopy |
| 9 (RLIN) |
1604 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Material Science |
| 9 (RLIN) |
6640 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Nanotechnology |
| 9 (RLIN) |
887 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Ayache, Jeanne. |
| 9 (RLIN) |
13785 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Ayache, Jeanne, |
| Dates associated with a name |
1951- |
| 9 (RLIN) |
13786 |
| 920 ## - |
|---|
| -- |
1441959742 (hdbk. : acid-free paper) |